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2019 | Journal Article | IST-REx-ID: 6554
Y. Xian, C. Lampert, B. Schiele, and Z. Akata, “Zero-shot learning - A comprehensive evaluation of the good, the bad and the ugly,” IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 41, no. 9, pp. 2251–2265, 2019.View | DOI | Download (ext.) | arXiv