Improved single-photon detection
Rangarajan R, Peters N, Hosten O, Altepeter J, Jeffrey E, Kwiat P. 2006. Improved single-photon detection. CLEO/QELS: Conference on Lasers and Electro-Optics / Quantum Electronics and Laser Science Conference.
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Conference Paper
| Published
Author
Rangarajan, Radhika;
Peters, Nicholas A;
Hosten, OnurISTA 
;
Altepeter, Joseph B;
Jeffrey, Evan R;
Kwiat, Paul G
;
Altepeter, Joseph B;
Jeffrey, Evan R;
Kwiat, Paul GAbstract
Visible light photon counters (VLPCs) and solid-state photomultipliers (SSPMs) facilitate efficient single-photon detection. We are attempting to improve their efficiency, previously limited to < 88% by coupling losses, via anti-reflection coatings, better electronics and cryogenics.
Publishing Year
Date Published
2006-01-01
Conference
CLEO/QELS: Conference on Lasers and Electro-Optics / Quantum Electronics and Laser Science Conference
IST-REx-ID
Cite this
Rangarajan R, Peters N, Hosten O, Altepeter J, Jeffrey E, Kwiat P. Improved single-photon detection. In: IEEE; 2006. doi:10.1109/CLEO.2006.4628641
Rangarajan, R., Peters, N., Hosten, O., Altepeter, J., Jeffrey, E., & Kwiat, P. (2006). Improved single-photon detection. Presented at the CLEO/QELS: Conference on Lasers and Electro-Optics / Quantum Electronics and Laser Science Conference, IEEE. https://doi.org/10.1109/CLEO.2006.4628641
Rangarajan, Radhika, Nicholas Peters, Onur Hosten, Joseph Altepeter, Evan Jeffrey, and Paul Kwiat. “Improved Single-Photon Detection.” IEEE, 2006. https://doi.org/10.1109/CLEO.2006.4628641.
R. Rangarajan, N. Peters, O. Hosten, J. Altepeter, E. Jeffrey, and P. Kwiat, “Improved single-photon detection,” presented at the CLEO/QELS: Conference on Lasers and Electro-Optics / Quantum Electronics and Laser Science Conference, 2006.
Rangarajan R, Peters N, Hosten O, Altepeter J, Jeffrey E, Kwiat P. 2006. Improved single-photon detection. CLEO/QELS: Conference on Lasers and Electro-Optics / Quantum Electronics and Laser Science Conference.
Rangarajan, Radhika, et al. Improved Single-Photon Detection. IEEE, 2006, doi:10.1109/CLEO.2006.4628641.
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