Wojtan, ChrisIST Austria ; Turk, Greg
We introduce a method for efficiently animating a wide range of deformable materials. We combine a high resolution surface mesh with a tetrahedral finite element simulator that makes use of frequent re-meshing. This combination allows for fast and detailed simulations of complex elastic and plastic behavior. We significantly expand the range of physical parameters that can be simulated with a single technique, and the results are free from common artifacts such as volume-loss, smoothing, popping, and the absence of thin features like strands and sheets. Our decision to couple a high resolution surface with low-resolution physics leads to efficient simulation and detailed surface features, and our approach to creating the tetrahedral mesh leads to an order-of-magnitude speedup over previous techniques in the time spent re-meshing. We compute masses, collisions, and surface tension forces on the scale of the fine mesh, which helps avoid visual artifacts due to the differing mesh resolutions. The result is a method that can simulate a large array of different material behaviors with high resolution features in a short amount of time.
ACM Transactions on Graphics
Wojtan CJ, Turk G. Fast viscoelastic behavior with thin features. ACM Transactions on Graphics. 2008;27(3). doi:10.1145/1360612.1360646
Wojtan, C. J., & Turk, G. (2008). Fast viscoelastic behavior with thin features. ACM Transactions on Graphics. ACM. https://doi.org/10.1145/1360612.1360646
Wojtan, Christopher J, and Greg Turk. “Fast Viscoelastic Behavior with Thin Features.” ACM Transactions on Graphics. ACM, 2008. https://doi.org/10.1145/1360612.1360646.
C. J. Wojtan and G. Turk, “Fast viscoelastic behavior with thin features,” ACM Transactions on Graphics, vol. 27, no. 3. ACM, 2008.
Wojtan CJ, Turk G. 2008. Fast viscoelastic behavior with thin features. ACM Transactions on Graphics. 27(3).
Wojtan, Christopher J., and Greg Turk. “Fast Viscoelastic Behavior with Thin Features.” ACM Transactions on Graphics, vol. 27, no. 3, ACM, 2008, doi:10.1145/1360612.1360646.
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