{"date_created":"2018-12-11T12:03:11Z","issue":"38","date_published":"2008-08-12T00:00:00Z","title":"Fully automated single-molecule force spectroscopy for screening applications","intvolume":"        19","publisher":"IOP Publishing Ltd.","doi":"10.1088/0957-4484/19/38/384020","day":"12","author":[{"first_name":"Jens","full_name":"Struckmeier, Jens","last_name":"Struckmeier"},{"last_name":"Wahl","first_name":"Reiner","full_name":"Wahl, Reiner"},{"full_name":"Leuschner, Mirko","first_name":"Mirko","last_name":"Leuschner"},{"full_name":"Nunes, Joao","first_name":"Joao","last_name":"Nunes"},{"full_name":"Harald Janovjak","first_name":"Harald L","id":"33BA6C30-F248-11E8-B48F-1D18A9856A87","orcid":"0000-0002-8023-9315","last_name":"Janovjak"},{"first_name":"Ulrich","full_name":"Geisler, Ulrich","last_name":"Geisler"},{"full_name":"Hofmann, Gerd","first_name":"Gerd","last_name":"Hofmann"},{"full_name":"Jähnke, Torsten","first_name":"Torsten","last_name":"Jähnke"},{"full_name":"Mueller, Daniel J","first_name":"Daniel","last_name":"Mueller"}],"publication_status":"published","date_updated":"2021-01-12T07:43:17Z","abstract":[{"lang":"eng","text":"With the introduction of single-molecule force spectroscopy (SMFS) it has become possible to directly access the interactions of various molecular systems. A bottleneck in conventional SMFS is collecting the large amount of data required for statistically meaningful analysis. Currently, atomic force microscopy (AFM)-based SMFS requires the user to tediously 'fish' for single molecules. In addition, most experimental and environmental conditions must be manually adjusted. Here, we developed a fully automated single-molecule force spectroscope. The instrument is able to perform SMFS while monitoring and regulating experimental conditions such as buffer composition and temperature. Cantilever alignment and calibration can also be automatically performed during experiments. This, combined with in-line data analysis, enables the instrument, once set up, to perform complete SMFS experiments autonomously."}],"_id":"3409","extern":1,"quality_controlled":0,"status":"public","type":"journal_article","publist_id":"2993","month":"08","volume":19,"publication":"Nanotechnology","year":"2008","citation":{"chicago":"Struckmeier, Jens, Reiner Wahl, Mirko Leuschner, Joao Nunes, Harald L Janovjak, Ulrich Geisler, Gerd Hofmann, Torsten Jähnke, and Daniel Mueller. “Fully Automated Single-Molecule Force Spectroscopy for Screening Applications.” <i>Nanotechnology</i>. IOP Publishing Ltd., 2008. <a href=\"https://doi.org/10.1088/0957-4484/19/38/384020\">https://doi.org/10.1088/0957-4484/19/38/384020</a>.","short":"J. Struckmeier, R. Wahl, M. Leuschner, J. Nunes, H.L. Janovjak, U. Geisler, G. Hofmann, T. Jähnke, D. Mueller, Nanotechnology 19 (2008).","apa":"Struckmeier, J., Wahl, R., Leuschner, M., Nunes, J., Janovjak, H. L., Geisler, U., … Mueller, D. (2008). Fully automated single-molecule force spectroscopy for screening applications. <i>Nanotechnology</i>. IOP Publishing Ltd. <a href=\"https://doi.org/10.1088/0957-4484/19/38/384020\">https://doi.org/10.1088/0957-4484/19/38/384020</a>","ama":"Struckmeier J, Wahl R, Leuschner M, et al. Fully automated single-molecule force spectroscopy for screening applications. <i>Nanotechnology</i>. 2008;19(38). doi:<a href=\"https://doi.org/10.1088/0957-4484/19/38/384020\">10.1088/0957-4484/19/38/384020</a>","ista":"Struckmeier J, Wahl R, Leuschner M, Nunes J, Janovjak HL, Geisler U, Hofmann G, Jähnke T, Mueller D. 2008. Fully automated single-molecule force spectroscopy for screening applications. Nanotechnology. 19(38).","ieee":"J. Struckmeier <i>et al.</i>, “Fully automated single-molecule force spectroscopy for screening applications,” <i>Nanotechnology</i>, vol. 19, no. 38. IOP Publishing Ltd., 2008.","mla":"Struckmeier, Jens, et al. “Fully Automated Single-Molecule Force Spectroscopy for Screening Applications.” <i>Nanotechnology</i>, vol. 19, no. 38, IOP Publishing Ltd., 2008, doi:<a href=\"https://doi.org/10.1088/0957-4484/19/38/384020\">10.1088/0957-4484/19/38/384020</a>."}}