Processing and editing of faces using a measurement-based skin reflectance model

B. Bickel, T. Weyrich, W. Matusik, H. Pfister, C. Donner, C. Tu, J. Mcandless, J. Lee, A. Ngan, H. Jensen, M. Groß, in:, ACM, 2006.

Download
No fulltext has been uploaded. References only!

Conference Paper | Published
Author
; ; ; ; ; ; ; ; ; ;
Publishing Year
Date Published
2006-07-01
Conference
SIGGRAPH: Special Interest Group on Computer Graphics and Interactive Techniques
IST-REx-ID

Cite this

Bickel B, Weyrich T, Matusik W, et al. Processing and editing of faces using a measurement-based skin reflectance model. In: ACM; 2006. doi:10.1145/1179849.1180059
Bickel, B., Weyrich, T., Matusik, W., Pfister, H., Donner, C., Tu, C., … Groß, M. (2006). Processing and editing of faces using a measurement-based skin reflectance model. Presented at the SIGGRAPH: Special Interest Group on Computer Graphics and Interactive Techniques, ACM. https://doi.org/10.1145/1179849.1180059
Bickel, Bernd, Tim Weyrich, Wojciech Matusik, Hanspeter Pfister, Craig Donner, Chien Tu, Janet Mcandless, et al. “Processing and Editing of Faces Using a Measurement-Based Skin Reflectance Model.” ACM, 2006. https://doi.org/10.1145/1179849.1180059.
B. Bickel et al., “Processing and editing of faces using a measurement-based skin reflectance model,” presented at the SIGGRAPH: Special Interest Group on Computer Graphics and Interactive Techniques, 2006.
Bickel B, Weyrich T, Matusik W, Pfister H, Donner C, Tu C, Mcandless J, Lee J, Ngan A, Jensen H, Groß M. 2006. Processing and editing of faces using a measurement-based skin reflectance model. SIGGRAPH: Special Interest Group on Computer Graphics and Interactive Techniques
Bickel, Bernd, et al. Processing and Editing of Faces Using a Measurement-Based Skin Reflectance Model. ACM, 2006, doi:10.1145/1179849.1180059.

Export

Marked Publications

Open Data IST Research Explorer

Search this title in

Google Scholar