Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography

A. Rastelli, M. Stoffel, Â. Malachias, T. Merdzhanova, G. Katsaros, K. Kern, T. Metzger, O. Schmidt, Nano Letters 8 (2008) 1404–1409.

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Journal Article | Published
Author
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Abstract
Scanning probe microscopy; Semiconductor quantum dots; Composition gradients; Composition profiles; Nanotomography; Single quantum dots; Strained sige/si; Three-dimensional (3D); Wet-chemical etchings; X-ray scattering measurements; quantum dot; methodology; nanotechnology; optical tomography; scanning probe microscopy; three dimensional imaging; Imaging, Three-Dimensional; Materials Testing; Microscopy, Scanning Probe; Nanotechnology; Quantum Dots; Tomography,
Publishing Year
Date Published
2008-05-01
Journal Title
Nano Letters
Acknowledgement
This work was supported by the BMBF (No. 03N8711) and the EU project D-DotFET (No. 012150)
Volume
8
Issue
5
Page
1404 - 1409
IST-REx-ID

Cite this

Rastelli A, Stoffel M, Malachias Â, et al. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. 2008;8(5):1404-1409. doi:10.1021/nl080290y
Rastelli, A., Stoffel, M., Malachias, Â., Merdzhanova, T., Katsaros, G., Kern, K., … Schmidt, O. (2008). Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters, 8(5), 1404–1409. https://doi.org/10.1021/nl080290y
Rastelli, Armando, Mathieu Stoffel, Ângelo Malachias, Tsvetelina Merdzhanova, Georgios Katsaros, Klaus Kern, Till Metzger, and Oliver Schmidt. “Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography.” Nano Letters 8, no. 5 (2008): 1404–9. https://doi.org/10.1021/nl080290y.
A. Rastelli et al., “Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography,” Nano Letters, vol. 8, no. 5, pp. 1404–1409, 2008.
Rastelli A, Stoffel M, Malachias Â, Merdzhanova T, Katsaros G, Kern K, Metzger T, Schmidt O. 2008. Three-dimensional composition profiles of single quantum dots determined by scanning-probe-microscopy-based nanotomography. Nano Letters. 8(5), 1404–1409.
Rastelli, Armando, et al. “Three-Dimensional Composition Profiles of Single Quantum Dots Determined by Scanning-Probe-Microscopy-Based Nanotomography.” Nano Letters, vol. 8, no. 5, American Chemical Society, 2008, pp. 1404–09, doi:10.1021/nl080290y.

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